Third-party testing center

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Huakong and TESCAN have jointly established the world's first in-situ 4D demonstration center, providing the most advanced and comprehensive in-situ solutions to users around the world;
The country's first TESCAN UniTOM XL high-throughput 230KCT is equipped with a spectrum CT module, which truly realizes synchrotron radiation-level rapid cloud-state 4D in-situ imaging, and can detect the composition contrast analysis inside the object under non-destructive conditions.

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Third-party testing center

Huakong and TESCAN have jointly established the world's first in-situ 4D demonstration center, providing the most advanced and comprehensive in-situ solutions to users around the world;
The country's first TESCAN UniTOM XL high-throughput 230KCT is equipped with a spectrum CT module, which truly realizes synchrotron radiation-level rapid cloud-state 4D in-situ imaging, and can detect the composition contrast analysis inside the object under non-destructive conditions.

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Third Party Testing Center

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  • Details

    ★Spatial resolution down to 600nm-Advanced nanofocus X-ray sources, precision stages, and high-quality detectors work together to provide imaging with sub-micron resolution.
    ★Perform true 4D imaging with dynamic CT-High temporal resolution, continuous and uninterrupted scanning, and specialized 4D software tools bring dynamic 4D capabilities similar to synchrotron radiation to the laboratory.
    ★Convenient 3D in-situ experiments-Continuous sample rotation and scanning enable uninterrupted in-situ experiments. The dedicated "cable-free" interface design simplifies experimental setup to the greatest extent.
    ★Accommodate samples of various sizes-UniTOM HR's high-power source (50W), multiple detector options (up to 3), and high-load-bearing stage (45kg) can accommodate samples of 500mmX700 mm (0xh) size.
    ★Maximize system utilization and high throughput-High-speed imaging detectors and high-throughput X-ray sources combine to achieve high temporal resolution tomography, allowing you to quickly scan samples to increase equipment throughput.