TXRD-DS Series in-situ loading system

Retail Price

Market price


The TXRD-DS series in-situ tester is a compact test system that can be integrated into imaging systems such as laser confocal microscopes and transmission X-ray diffractometers to achieve high-resolution in-situ testing, and can be configured with high-temperature and low-temperature modules.
It is widely used in aerospace, geology, shipbuilding, biomedicine, electronic devices and other fields. It conducts mechanical testing and analysis on products such as rocks, metals, composite materials, and ceramics; and combines the microscopic imaging system to study the damage mechanism of materials under stress, such as phase change behavior, orientation change, crack initiation and expansion.

Weight

Quantity
-
+

Inventory

隐藏域元素占位

TXRD-DS Series in-situ loading system

The TXRD-DS series in-situ tester is a compact test system that can be integrated into imaging systems such as laser confocal microscopes and transmission X-ray diffractometers to achieve high-resolution in-situ testing, and can be configured with high-temperature and low-temperature modules.
It is widely used in aerospace, geology, shipbuilding, biomedicine, electronic devices and other fields. It conducts mechanical testing and analysis on products such as rocks, metals, composite materials, and ceramics; and combines the microscopic imaging system to study the damage mechanism of materials under stress, such as phase change behavior, orientation change, crack initiation and expansion.

Classification:

Laser Confocal Microscope, Transmission X-Ray Diffractometer Loading System

Return to List
  • Details

    Application and technical parameters
    ● Maximum force: 5kN;
    ● Force accuracy: 0.5% of indicated value or 0.1%FS;
    ● Temperature: -150℃~1200℃;
    ● Temperature control accuracy: ±1℃;
    ● Displacement: 0-10mm;
    ● Displacement accuracy: 0.1um;
    ● Test speed: 0.001-10mm/min.

     

    TXRD-DS Series

    Application under laser confocal microscope

    Transmission X-ray Diffractometer Application

     

Previous Page

Next Page