TXRD-DS series products combined with laser confocal microscope for high temperature tension and compression imaging
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The TXRD-DS series in-situ tester can achieve high-resolution in-situ testing when equipped with a laser confocal microscope imaging system, and can be configured with high-temperature and low-temperature modules.
Widely used in aerospace, geology, shipbuilding, biomedicine, electronic devices and other fields. Mechanical testing and analysis of rock, metal, composite materials, ceramics and other products; and combined with a microscopic imaging system to study the damage mechanism of materials in orientation change, crack initiation and expansion.
Widely used in aerospace, geology, shipbuilding, biomedicine, electronic devices and other fields. Mechanical testing and analysis of rock, metal, composite materials, ceramics and other products; and combined with a microscopic imaging system to study the damage mechanism of materials in orientation change, crack initiation and expansion.
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TXRD-DS series products combined with laser confocal microscope for high temperature tension and compression imaging
The TXRD-DS series in-situ tester can achieve high-resolution in-situ testing when equipped with a laser confocal microscope imaging system, and can be configured with high-temperature and low-temperature modules.
Widely used in aerospace, geology, shipbuilding, biomedicine, electronic devices and other fields. Mechanical testing and analysis of rock, metal, composite materials, ceramics and other products; and combined with a microscopic imaging system to study the damage mechanism of materials in orientation change, crack initiation and expansion.
Widely used in aerospace, geology, shipbuilding, biomedicine, electronic devices and other fields. Mechanical testing and analysis of rock, metal, composite materials, ceramics and other products; and combined with a microscopic imaging system to study the damage mechanism of materials in orientation change, crack initiation and expansion.
Classification:
Scientific Research Equipment
- Details
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Technical parameters
● Maximum force: 5kN;
● Force accuracy: 0.5% of indication or 0.1%FS;
● Temperature: -150°C~1200°C;
● Temperature control accuracy: ±1°C;
● Displacement: 0-10mm;
● Displacement accuracy: 0.1um;
● Test speed: 0.001-10mm/min.